Objective To analyze the risk factors for venous thrombosis related to the lead of cardiovascular implantable electronic device (CIED) in order to provide the theoretical basis for clinical prevention. Methods A total of 112 patients undergoing CIED implantation and with full follow-up data who hospitalized in our department from September 2013 to December 2015 were recruited in this study. According to the results of postoperative vascular ultrasound examination, they were assigned to the thrombosis group [n=56, at an age of (71.86±8.35) years] and the non-thrombosis group [n=56, at an age of (71.23±10.62) years]. Their clinical data were collected and retrospectively analyzed. Multivariate logistic regression analysis was applied to assess the risk factors of the related venous thrombosis. Results There were significant differences in the numbers of patients with atrial fibrillation, those with implanted defibrillator leads and those taking anticoagulant medications, the left ventricular ejection fraction, the serum level of glycosylated hemoglobin, as well as the times of venipuncture, operation time, and lead numbers between the thrombosis and the non-thrombosis groups (P<0.05). Multivariate logistic regression analysis showed atrial fibrillation, times of venipuncture, operation time and lead numbers were the risk factors for the related venous thrombosis, and administration of anticoagulant medications was the protective factor. Conclusion Atrial fibrillation, times of venipuncture, operation time and lead numbers are the independent risk factors for venous thrombosis related to CIED leads.